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The Removal of Si3N4 Particles from the Wafer Surface Using Supercritical Carbon Dioxide Cleaning
Kim YH  Choi HW  Kang KM  Karakin A  Lim KT

Vol. 24, No. 3, pp. 157-165, Sep. 2018
10.7464/ksct.2018.24.3.157

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pISSN : 1598 - 9712
eISSN : 2288 - 0690

한국연구재단 등재학술지